VectorStar™ Opto-Electronic Network Analyzers

ME7848A

The VectorStar ME7848A opto-electronic network analyzer (ONA) provides a modular approach to optical measurements of O/E, E/O, and O/O devices operating at 850, 1310, and 1550 nm wavelengths. There are two configurations available: the VectorStar ME7848A-100 series includes the MN4765B O/E calibration module and the VectorStar ME7848A-200 series adds the MN4775A E/O converter.

The VectorStar ME7848A-200 series provides the ability to quickly switch between O/E, E/O, and O/O measurements with specified traceable measurements established by the MN4765B O/E calibration module.

The VectorStar ME7848A ONA can be easily modified to different wavelengths by adding the appropriate MN4775A E/O converter and MN4765B O/E calibration detector. The VectorStar ME7838A-100 series can be upgraded to a 200 series by including the appropriate MN4775A E/O converter.

Measurement Capabilities

With the addition of the two modulators, VectorStar, along with a 110 GHz O/E photodetector, can make the following measurements. The inherent advantages that we had on the 70 GHz system are still applicable to the 110 GHz system, namely upgradability, flexibility of making opto-electronic and E/E measurements, and NIST traceability on the reference calibration photodetector.

• Responsivity parameters (frequency response, conversion efficiency, gain of receiver, etc.)
• Transfer functions
• Group delay measurements
• Optical losses
• Balanced measurements (four port differential frequency response, gain, etc. for differential electro-optical devices)
• E/E measurements (S11/S22)

Opto-Electronic Features

• Fast and accurate opto-electronic measurements — The VectorStar ME7848A 200 series ONA enables error-corrected transfer function, group delay, and return loss measurements of E/O and O/E components and subsystems.
• MN4765B O/E calibration module — The O/E calibration module is a thermally stabilized photodiode reference standard detector that can eliminate drift over temperature. Accurate bias voltage to the photodiode is maintained internally.
• MN4775A E/O converter — The E/O converter includes a lithium niobate (LiNbO3) modulator stabilized by a fully automatic bias controller and a tunable or fixed wavelength laser source. Excellent converter stability ensures characteristics remain consistent during measurement of opto-electronic DUT detectors and receivers.
• National Institute of Standards and Technology (NIST) derived characterization — Magnitude and phase characterization of the O/E calibration module is obtained using a primary standard characterized by NIST and held in the Anritsu Calibration Lab.
• Internal VNA de-embedding for simplified calibration — The built-in application menus provide instructions that guide the user through the set-up and calibrations required for making E/O, O/O, and O/E measurements.
• Excellent stability and repeatability — Use of full 12-term calibration with de-embedding results in stable and repeatable measurements of opto-electronic devices using the VectorStar VNA.
• Modularity and upgradeability — The VectorStar ME7848A ONA can be easily modified to a different wavelength by adding the appropriate MN4775A E/O converter and MN4765B O/E calibration detector. The VectorStar ME7838A 100 series can be upgraded to a 200 series by including the appropriate MN4775A E/O converter.

Spectrum Analyzer Option

• SPA available from 70KHz to 20/40/70/110/125/145 and 220GHz. Also available for banded configuration to 1.1THz.
• Dual SPA mode available: suitable for Mixers/Amplifier/ Harmonics /Spurious testing.
• SPA available on all ports. User can define which port to use as SPA port.
• Several detection types available in classical mode: Peak, minimum, RMS, Mean.
• Various math functions can be applied on SPA mode like Min hold/max hold/ user defined equations.
• Sources and receivers can be independently configured. Can be used as Tracking Generator.
• For units that have a dual source, a dual drive option is available. Support for external source control also possible.
• Phase synchronization for units with Dual source available. This feature allows users to control and configure the phase between the two sources.
• Source and receiver attenuator available with VNA can be activated in SPA mode. Recommendation to use option 62 (with attenuator on receiver side) for measuring the spectrum content of high-power devices.
• Software option: easy to install and upgrade existing user equipment.

Other Features

• Broadest frequency span from a single coaxial test port covering 70 kHz to 70 GHz in a single instrument and 70 kHz to 145 GHz in the Broadband configuration. Extendable to 1.1 THz
• Universal Fixture Extraction (UFX) software option provides advanced de-embedding tools for test fixture extraction.
• IMDView™ software coupled with the internal combiner option offers the ability to switch from S parameters to IMD measurements in a single connection
• Highest performance pulse measurements— PulseView™ offers 2.5 ns pulse resolution with 100 dB dynamic range
• 4-port single-ended or balanced measurements using DifferentialView™ analysis
• Internal trace-based eye diagram option provides the ability to display Time Domain, S-Parameters, and Eye Diagram analysis with active sweep updates
• Superior Dynamic Range - up to 142 dB
• High available power - up to +14 dBm
• Best test port characteristic performance - up to 50 dB in Directivity
• Best time domain analysis
• Fast and accurate optoelectronic measurements from 70 kHz to 40, 70 GHz and 110 GHz, at 850, 1060, 1310 and 1550 nm wavelengths, using MN4765B O/E Calibration module